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Novotny, Ivan

 
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Novotny, Ivan
   
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Automation, since 1950
Literature
 
thumbnail of29259009 Growth and characterization of ZnO thin films using XRD and AFM, in: IWK - Internationales wissenschaftliches Kolloquium // Technische Universität Ilmenau; Tagungsband, 53. IWK - Internationales Wissenschaftliches Kolloquium
Author: Hotovy, Juraj; Kups, T.; Kovac, Jaroslav; Spieß, Lothar; Novotny, Ivan; Kovac, Jaroslav
Published: 2008
 
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