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Metrologisches Rasterkraftmikroskop, in: 50. IWK - Internationales Wissenschaftliches Kolloquium

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Author Dorozhovets, Nataliya; Hausotte, Tino; Manske, Eberhard; Jäger, Gerd
Published  TU Ilmenau, Ilmenau, 2005
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2000 and later
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no fulltext found 50. IWK - Internationales Wissenschaftliches Kolloquium | 50. IWK - International Scientific Colloquium
Author: Sendler, Jan; Trutschel, Ralf; Augsburg, Klaus; Heimann, Stefan; Holstein, Peter; Franck, U.; Mackenzie, David; Andrei, Costică I.; Micu, Constantin; Kostrakiewicz, S.; Weiß, A.; Kurtz, Peter; Sievers, Gunnar; Schlütter, Beate; Schmauder, Martin; Höhn, Katrin; Krengel, Michael; Franke, Ingmar S.; Schlönhardt, Frank; Bartsch, Heinz; Padun, B. S.; Ilienkov, R. V.; Brecht, Rike; Brix, Torsten; [...]
Published: 2005
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Documents: 50. IWK - Internationales Wissenschaftliches Kolloquium
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DMG-Lib FaviconDMG-Lib https://www.dmg-lib.org/dmglib/handler?docum=26704009
Europeana FaviconEuropeana  http://www.europeana.eu/portal/record/2020801/dmglib_handler_docum_26704009.html
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ITUIlmenau TU  http://www.tu-ilmenau.de
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Time of publication 2005

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